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T. Sridhar. A New Parallel Test Approach for Large Memories. In Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985. pages 462-470, IEEE Computer Society, 1985.
Possibly Related PublicationsThe following publications are possibly variants of this publication: A New Parallel Test Approach for Large MemoriesThirumalai Sridhar. dt, 3(4):15-22, 1986. [doi]
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