Ganesh Srinivasan, Hui-Chuan Chao, Friedrich Taenzler. Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1-9, IEEE, 2008. [doi]
Abstract is missing.