CMOS RF reliability for 5G mmWave applications - Challenges and Opportunities

P. Srinivasan, F. Guarin. CMOS RF reliability for 5G mmWave applications - Challenges and Opportunities. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-7, IEEE, 2021. [doi]

Abstract

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