Rajagopalan Srinivasan, Sandeep K. Gupta, Melvin A. Breuer. Novel Test Pattern Generators for Pseudo-Exhaustive Testing. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 1041-1050, IEEE Computer Society, 1993.
Abstract is missing.