P. Srinivasan, F. Guarin, S. Syed, Joris Angelo Sundaram Jerome, W. Liu, S. Jain, D. Lederer, Stephen Moss, Paul Colestock, A. Bandyopadhyay, N. Cahoon, B. Min, M. Gall. RF Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-6, IEEE, 2021. [doi]
Abstract is missing.