Shweta Srivastava, Jaijeet S. Roychowdhury. Rapid Estimation of the Probability of SRAM Failure due to MOS Threshold Variations. In Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, CICC 2007, DoubleTree Hotel, San Jose, California, USA, September 16-19, 2007. pages 229-232, IEEE, 2007. [doi]
Abstract is missing.