Zoran Stamenkovic, Alberto Bosio, György Cserey, Ondrej Novák, Witold A. Pleskacz, Lukás Sekanina, Andreas Steininger, Goran Stojanovic, Viera Stopjaková. International Symposium on Design and Diagnostics of Electronic Circuits and Systems. In IEEE International Test Conference, ITC 2019, Washington, DC, USA, November 9-15, 2019. pages 1-4, IEEE, 2019. [doi]
Abstract is missing.