Z. Stamenkovic, N. D. Vasovic, G. S. Ristic. Automatic and reliable electrical characterization of MOSFETs. In 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2014, Warsaw, Poland, 23-25 April, 2014. pages 262-265, IEEE, 2014. [doi]
Abstract is missing.