The Selective Pull-Up (SP) Noise Immunity Scheme for Dynamic Circuits

Mircea R. Stan, Avishek Panigrahi. The Selective Pull-Up (SP) Noise Immunity Scheme for Dynamic Circuits. In 2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France. pages 1106, IEEE Computer Society, 2002. [doi]

Abstract

Abstract is missing.