Analysis of substrate currents propagation in HVCMOS technology

Camillo Stefanucci, Pietro Buccella, Ehrenfried Seebacher, Alexander Steinmair, Maher Kayal, Jean-Michel Sallese. Analysis of substrate currents propagation in HVCMOS technology. In 46th European Solid-State Device Research Conference, ESSDERC 2016, Lausanne, Switzerland, September 12-15, 2016. pages 319-322, IEEE, 2016. [doi]

Abstract

Abstract is missing.