Kinetic Monte Carlo modeling of the charge transport in a HfO2-based ReRAM with a rough anode - researchr publication authors

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Wilhelm Stehling, Elhameh Abbaspour, Christoph Jungemann, Stephan Menzel. Kinetic Monte Carlo modeling of the charge transport in a HfO2-based ReRAM with a rough anode. In 17th Non-Volatile Memory Technology Symposium, NVMTS 2017, Aachen, Germany, August 30 - Sept. 1, 2017. pages 1-4, IEEE, 2017. [doi]

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