Wilhelm Stehling, Elhameh Abbaspour, Christoph Jungemann, Stephan Menzel. Kinetic Monte Carlo modeling of the charge transport in a HfO2-based ReRAM with a rough anode. In 17th Non-Volatile Memory Technology Symposium, NVMTS 2017, Aachen, Germany, August 30 - Sept. 1, 2017. pages 1-4, IEEE, 2017. [doi]
@inproceedings{StehlingAJM17,
title = {Kinetic Monte Carlo modeling of the charge transport in a HfO2-based ReRAM with a rough anode},
author = {Wilhelm Stehling and Elhameh Abbaspour and Christoph Jungemann and Stephan Menzel},
year = {2017},
doi = {10.1109/NVMTS.2017.8171310},
url = {https://doi.org/10.1109/NVMTS.2017.8171310},
researchr = {https://researchr.org/publication/StehlingAJM17},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {17th Non-Volatile Memory Technology Symposium, NVMTS 2017, Aachen, Germany, August 30 - Sept. 1, 2017},
publisher = {IEEE},
isbn = {978-1-5386-0477-9},
}