Maarten Steinbuch, Koos van Berkel, George A. L. Leenknegt, Tom Oomen, Jeroen van de Wijdeven. Reading of cracked optical discs using Iterative Learning Control. In American Control Conference, ACC 2009. St. Louis, Missouri, USA, June 10-12, 2009. pages 258-263, IEEE, 2009. [doi]
Abstract is missing.