Assessing SiCr resistor drift for automotive analog ICs

K. A. Stewart, K. Kimura, M. Ring, K. Noldus, P. Hulse, R. C. Jerome, A. Hasegawa, J. P. Gambino, D. T. Price. Assessing SiCr resistor drift for automotive analog ICs. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-4, IEEE, 2021. [doi]

Abstract

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