Edward A. Stott, Justin S. Wong, N. Pete Sedcole, Peter Y. K. Cheung. Degradation in FPGAs: measurement and modelling. In Peter Y. K. Cheung, John Wawrzynek, editors, Proceedings of the ACM/SIGDA 18th International Symposium on Field Programmable Gate Arrays, FPGA 2010, Monterey, California, USA, February 21-23, 2010. pages 229-238, ACM, 2010. [doi]
Abstract is missing.