Exploiting Network-on-Chip structural redundancy for a cooperative and scalable built-in self-test architecture

Alessandro Strano, Crispín Gómez Requena, Daniele Ludovici, Michele Favalli, María Engracia Gómez, Davide Bertozzi. Exploiting Network-on-Chip structural redundancy for a cooperative and scalable built-in self-test architecture. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 661-666, IEEE, 2011. [doi]

Authors

Alessandro Strano

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Crispín Gómez Requena

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Daniele Ludovici

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Michele Favalli

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María Engracia Gómez

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Davide Bertozzi

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