Haralampos-G. D. Stratigopoulos, Petros Drineas, Mustapha Slamani, Yiorgos Makris. Non-RF to RF Test Correlation Using Learning Machines: A Case Study. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA. pages 9-14, IEEE Computer Society, 2007. [doi]
Abstract is missing.