Haralampos-G. D. Stratigopoulos, Yiorgos Makris. Constructive Derivation of Analog Specification Test Criteria. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. pages 395-400, IEEE Computer Society, 2005. [doi]
Abstract is missing.