M. Streibl, K. Esmark, A. Sieck, Wolfgang Stadler, M. Wendel, J. Szatkowski, Harald Gossner. Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies. Microelectronics Reliability, 43(7):1001-1010, 2003. [doi]
@article{StreiblESSWSG03,
title = {Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies},
author = {M. Streibl and K. Esmark and A. Sieck and Wolfgang Stadler and M. Wendel and J. Szatkowski and Harald Gossner},
year = {2003},
doi = {10.1016/S0026-2714(03)00126-4},
url = {http://dx.doi.org/10.1016/S0026-2714(03)00126-4},
tags = {rule-based},
researchr = {https://researchr.org/publication/StreiblESSWSG03},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {43},
number = {7},
pages = {1001-1010},
}