Jonas Stricker, Clemens Kain, Jérôme Kirscher, Andi Buzo, Linus Maurer, Georg Pelz. Semiconductor Component Fault Assessment and Probability Impact Estimation on Application Level. In Jari Nurmi, Peeter Ellervee, Juri Mihhailov, Maksim Jenihhin, Kalle Tammemäe, editors, 2018 IEEE Nordic Circuits and Systems Conference, NORCAS 2018: NORCHIP and International Symposium of System-on-Chip (SoC), Tallinn, Estonia, October 30-31, 2018. pages 1-4, IEEE, 2018. [doi]
Abstract is missing.