Andrzej J. Strojwas, Jacob A. Abraham, Hong Hao, Max M. Shulaker. Keynote address: Challenges and opportunities in electrical characterization and test for 14nm and below. In 34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016. pages 1-2, IEEE Computer Society, 2016. [doi]
Abstract is missing.