Andrzej J. Strojwas, Clark Beck, Dennis Buss, Tülin Erdim Mangir, Charles H. Stapper. Yield of VLSI circuits: myths vs. reality (panel). In DAC. pages 234-235, 1986. [doi]
@inproceedings{StrojwasBBMS86,
title = {Yield of VLSI circuits: myths vs. reality (panel)},
author = {Andrzej J. Strojwas and Clark Beck and Dennis Buss and Tülin Erdim Mangir and Charles H. Stapper},
year = {1986},
doi = {10.1145/318013.318050},
url = {http://doi.acm.org/10.1145/318013.318050},
researchr = {https://researchr.org/publication/StrojwasBBMS86},
cites = {0},
citedby = {0},
pages = {234-235},
booktitle = {DAC},
}