Charles E. Stroud, M. Ding, S. Seshadri, Ramesh Karri, I. Kim, S. Roy, S. Wu. A Parameterized VHDL Library for On-Line Testing. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 479-488, IEEE Computer Society, 1997.
@inproceedings{StroudDSKKRW97,
title = {A Parameterized VHDL Library for On-Line Testing},
author = {Charles E. Stroud and M. Ding and S. Seshadri and Ramesh Karri and I. Kim and S. Roy and S. Wu},
year = {1997},
tags = {testing},
researchr = {https://researchr.org/publication/StroudDSKKRW97},
cites = {0},
citedby = {0},
pages = {479-488},
booktitle = {Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997},
publisher = {IEEE Computer Society},
isbn = {0-7803-4209-7},
}