Charles E. Stroud, M. Ding, S. Seshadri, Ramesh Karri, I. Kim, S. Roy, S. Wu. A Parameterized VHDL Library for On-Line Testing. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 479-488, IEEE Computer Society, 1997.
Abstract is missing.