BIST-Based Diagnostics of FPGA Logic Blocks

Charles E. Stroud, Eric Lee, Miron Abramovici. BIST-Based Diagnostics of FPGA Logic Blocks. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 539-547, IEEE Computer Society, 1997.

Authors

Charles E. Stroud

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Eric Lee

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Miron Abramovici

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