Charles E. Stroud, Eric Lee, Miron Abramovici. BIST-Based Diagnostics of FPGA Logic Blocks. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 539-547, IEEE Computer Society, 1997.
@inproceedings{StroudLA97,
title = {BIST-Based Diagnostics of FPGA Logic Blocks},
author = {Charles E. Stroud and Eric Lee and Miron Abramovici},
year = {1997},
tags = {rule-based, model-based diagnostics, diagnostics, e-science, logic},
researchr = {https://researchr.org/publication/StroudLA97},
cites = {0},
citedby = {0},
pages = {539-547},
booktitle = {Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997},
publisher = {IEEE Computer Society},
isbn = {0-7803-4209-7},
}