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Using ILA Testing for BIST in FPGAs

Charles E. Stroud, Eric Lee, Srinivasa Konala, Miron Abramovici. Using ILA Testing for BIST in FPGAs. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 68-75, IEEE Computer Society, 1996.

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