Built-in self-test of FPGA interconnect

Charles E. Stroud, Sajitha Wijesuriya, Carter Hamilton, Miron Abramovici. Built-in self-test of FPGA interconnect. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 404-411, IEEE Computer Society, 1998. [doi]

Abstract

Abstract is missing.