Chauchin Su, Yi-Ren Cheng, Yue-Tsang Chen, Shing Tenchen. Analog signal metrology for mixed signal ICs. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 194, IEEE Computer Society, 1997. [doi]
@inproceedings{SuCCT97,
title = {Analog signal metrology for mixed signal ICs},
author = {Chauchin Su and Yi-Ren Cheng and Yue-Tsang Chen and Shing Tenchen},
year = {1997},
url = {http://csdl.computer.org/comp/proceedings/ats/1997/8209/00/82090194abs.htm},
researchr = {https://researchr.org/publication/SuCCT97},
cites = {0},
citedby = {0},
pages = {194},
booktitle = {6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan},
publisher = {IEEE Computer Society},
isbn = {0-8186-8209-4},
}