Studying the Impact of Gate Tunneling on Dynamic Behaviors of Partially-Depleted SOI CMOS Using BSIMPD - researchr publication authors

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Pin Su, Samel K. H. Fung, Weidong Liu, Chenming Hu. Studying the Impact of Gate Tunneling on Dynamic Behaviors of Partially-Depleted SOI CMOS Using BSIMPD. In ISQED. pages 487-491, 2002. [doi]

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