Studying the Impact of Gate Tunneling on Dynamic Behaviors of Partially-Depleted SOI CMOS Using BSIMPD

Pin Su, Samel K. H. Fung, Weidong Liu, Chenming Hu. Studying the Impact of Gate Tunneling on Dynamic Behaviors of Partially-Depleted SOI CMOS Using BSIMPD. In ISQED. pages 487-491, 2002. [doi]

@inproceedings{SuFLH02,
  title = {Studying the Impact of Gate Tunneling on Dynamic Behaviors of Partially-Depleted SOI CMOS Using BSIMPD},
  author = {Pin Su and Samel K. H. Fung and Weidong Liu and Chenming Hu},
  year = {2002},
  url = {http://computer.org/proceedings/isqed/1561/15610487abs.htm},
  researchr = {https://researchr.org/publication/SuFLH02},
  cites = {0},
  citedby = {0},
  pages = {487-491},
  booktitle = {ISQED},
}