Fei Su, William L. Hwang, Arindam Mukherjee, Krishnendu Chakrabarty. Defect-oriented testing and diagnosis of digital microfluidics-based biochips. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 10, IEEE, 2005. [doi]
Abstract is missing.