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Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Chien-Chung Hung, Ming-Jer Kao, Yeong-Jar Chang, Wen Ching Wu. MRAM Defect Analysis and Fault Modeli. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 124-133, IEEE, 2004. [doi]

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