Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Chien-Chung Hung, Ming-Jer Kao, Yeong-Jar Chang, Wen Ching Wu. MRAM Defect Analysis and Fault Modeli. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 124-133, IEEE, 2004. [doi]
@inproceedings{SuHWHKCW04,
title = {MRAM Defect Analysis and Fault Modeli},
author = {Chin-Lung Su and Rei-Fu Huang and Cheng-Wen Wu and Chien-Chung Hung and Ming-Jer Kao and Yeong-Jar Chang and Wen Ching Wu},
year = {2004},
doi = {10.1109/ITC.2004.123},
url = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.123},
tags = {analysis},
researchr = {https://researchr.org/publication/SuHWHKCW04},
cites = {0},
citedby = {0},
pages = {124-133},
booktitle = {Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA},
publisher = {IEEE},
isbn = {0-7803-8581-0},
}