Testability and Dependability of AI Hardware: Survey, Trends, Challenges, and Perspectives

Fei Su, Chunsheng Liu, Haralampos-G. Stratigopoulos. Testability and Dependability of AI Hardware: Survey, Trends, Challenges, and Perspectives. IEEE Design & Test of Computers, 40(2):8-58, April 2023. [doi]

Abstract

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