Defect-tolerant logic hardening for crossbar-based nanosystems

Yehua Su, Wenjing Rao. Defect-tolerant logic hardening for crossbar-based nanosystems. In Enrico Macii, editor, Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013. pages 1801-1806, EDA Consortium San Jose, CA, USA / ACM DL, 2013. [doi]

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