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The characterization of retention properties of metal-ferroelectric (PbZr::0.53::Ti::0.47::O::3::)-insulator (Dy::2::O::3::, Y::2::O::3::)-semiconductor devices

Yu-Di Su, Wen-Chieh Shih, Joseph Ya-min Lee. The characterization of retention properties of metal-ferroelectric (PbZr::0.53::Ti::0.47::O::3::)-insulator (Dy::2::O::3::, Y::2::O::3::)-semiconductor devices. Microelectronics Reliability, 47(4-5):619-622, 2007. [doi]

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