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Enhanced Probe Card Facilities At-Speed Wafer Probing in Very High Density Applications

Eswar Subramanian, Randy Nelson. Enhanced Probe Card Facilities At-Speed Wafer Probing in Very High Density Applications. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 936-939, IEEE Computer Society, 1992.

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