RF Transconductor Linearization Robust to Process, Voltage and Temperature Variations

Harish Kundur Subramaniyan, Eric A. M. Klumperink, Venkatesh Srinivasan, Ali Kiaei, Bram Nauta. RF Transconductor Linearization Robust to Process, Voltage and Temperature Variations. J. Solid-State Circuits, 50(11):2591-2602, 2015. [doi]

Abstract

Abstract is missing.