Ikuo Suda, Ryo Kishida, Kazutoshi Kobayashi. An Aging Degradation Suppression Scheme at Constant Performance by Controlling Supply Voltage and Body Bias in a 65 nm Fully-Depleted Silicon-On-Insulator Process. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 4-1, IEEE, 2022. [doi]
Abstract is missing.