Predictive Test Technique for Diagnosis of RF CMOS Receivers

Kay Suenaga, Sebastiàn A. Bota, Rodrigo Picos, Eugeni Isern, Miquel Roca, Eugeni García-Moreno. Predictive Test Technique for Diagnosis of RF CMOS Receivers. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 129-133, IEEE Computer Society, 2009. [doi]

Abstract

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