Masao Sugai, Takayuki Nakatani. AC Dynamic Testing of 20Bit Sigma-Delta Over-Sampling D/A Converter on a Mixed Signal Test System. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 321-327, IEEE Computer Society, 1992.
Abstract is missing.