Karen Sugden, Eilis J. Hannon, Louise Arseneault, Daniel W. Belsky, David L. Corcoran, Helen L. Fisher, Renate M. Houts, Radhika Kandaswamy, Terrie E. Moffitt, Richie Poulton, Joseph A. Prinz, Line J. H. Rasmussen, Benjamin S. Williams, Chloe C. Y. Wong, Jonathan Mill, Avshalom Caspi. Patterns of Reliability: Assessing the Reproducibility and Integrity of DNA Methylation Measurement. Patterns, 1(2):100014, 2020. [doi]
@article{SugdenHABCFHKMP20,
title = {Patterns of Reliability: Assessing the Reproducibility and Integrity of DNA Methylation Measurement},
author = {Karen Sugden and Eilis J. Hannon and Louise Arseneault and Daniel W. Belsky and David L. Corcoran and Helen L. Fisher and Renate M. Houts and Radhika Kandaswamy and Terrie E. Moffitt and Richie Poulton and Joseph A. Prinz and Line J. H. Rasmussen and Benjamin S. Williams and Chloe C. Y. Wong and Jonathan Mill and Avshalom Caspi},
year = {2020},
doi = {10.1016/j.patter.2020.100014},
url = {https://doi.org/10.1016/j.patter.2020.100014},
researchr = {https://researchr.org/publication/SugdenHABCFHKMP20},
cites = {0},
citedby = {0},
journal = {Patterns},
volume = {1},
number = {2},
pages = {100014},
}