Karen Sugden, Eilis J. Hannon, Louise Arseneault, Daniel W. Belsky, David L. Corcoran, Helen L. Fisher, Renate M. Houts, Radhika Kandaswamy, Terrie E. Moffitt, Richie Poulton, Joseph A. Prinz, Line J. H. Rasmussen, Benjamin S. Williams, Chloe C. Y. Wong, Jonathan Mill, Avshalom Caspi. Patterns of Reliability: Assessing the Reproducibility and Integrity of DNA Methylation Measurement. Patterns, 1(2):100014, 2020. [doi]
Abstract is missing.