Optimization of Test Accesses with a Combined BIST and External Test Scheme - researchr publication authors

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Makoto Sugihara, Hiroto Yasuura. Optimization of Test Accesses with a Combined BIST and External Test Scheme. In Proceedings of the ASPDAC 2002 / VLSI Design 2002, CD-ROM, 7-11 January 2002, Bangalore, India. pages 683-688, IEEE Computer Society, 2002. [doi]

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