Toshiyuki Sugimoto, Hiromu Ishii, Yoshio Higashiyama. Non Contacting Measurement of Surface Resistivity Using Phi Type Electrodes. In Industry Applications Society Annual Meeting, IAS 2008, Edmonton, Alberta, Canada, 5-9 Octobert, 2008. pages 1-6, IEEE, 2008. [doi]
@inproceedings{SugimotoIH08,
title = {Non Contacting Measurement of Surface Resistivity Using Phi Type Electrodes},
author = {Toshiyuki Sugimoto and Hiromu Ishii and Yoshio Higashiyama},
year = {2008},
doi = {10.1109/08IAS.2008.110},
url = {http://dx.doi.org/10.1109/08IAS.2008.110},
researchr = {https://researchr.org/publication/SugimotoIH08},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {Industry Applications Society Annual Meeting, IAS 2008, Edmonton, Alberta, Canada, 5-9 Octobert, 2008},
publisher = {IEEE},
isbn = {978-1-4244-2278-4},
}