A temperature-stabilized voltage reference utilizing MOS body effect

Haesick Sul, Young-Hyun Jun, Bai-Sun Kong. A temperature-stabilized voltage reference utilizing MOS body effect. In 2012 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2010, Kuala Lumpur, Malaysia, December 6-9, 2010. pages 792-795, IEEE, 2010. [doi]

Abstract

Abstract is missing.