Understanding customer returns from a test perspective

Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir. Understanding customer returns from a test perspective. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 2-7, IEEE Computer Society, 2011. [doi]

@inproceedings{SumikawaDWWA11,
  title = {Understanding customer returns from a test perspective},
  author = {Nik Sumikawa and Dragoljub Gagi Drmanac and Li-C. Wang and LeRoy Winemberg and Magdy S. Abadir},
  year = {2011},
  doi = {10.1109/VTS.2011.5783746},
  url = {http://dx.doi.org/10.1109/VTS.2011.5783746},
  tags = {testing, C++},
  researchr = {https://researchr.org/publication/SumikawaDWWA11},
  cites = {0},
  citedby = {0},
  pages = {2-7},
  booktitle = {29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA},
  publisher = {IEEE Computer Society},
}