ST-YOLO: An Improved Metal Defect Detection Model Based on Yolov5 - researchr publication authors

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Sijin Sun, Ming Deng, Jiawei Luo, Xiaohang Zheng, Yang Pan. ST-YOLO: An Improved Metal Defect Detection Model Based on Yolov5. In Proceedings of the 2024 3rd Asia Conference on Algorithms, Computing and Machine Learning, CACML 2024, Shanghai, China, March 22-24, 2024. pages 158-164, ACM, 2024. [doi]

This author has not been identified. Look up 'Sijin Sun' in GoogleThis author has not been identified. Look up 'Ming Deng' in GoogleThis author has not been identified. Look up 'Jiawei Luo' in GoogleThis author has not been identified. Look up 'Xiaohang Zheng' in GoogleThis author has not been identified. Look up 'Yang Pan' in Google

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