Sijin Sun, Ming Deng, Jiawei Luo, Xiaohang Zheng, Yang Pan. ST-YOLO: An Improved Metal Defect Detection Model Based on Yolov5. In Proceedings of the 2024 3rd Asia Conference on Algorithms, Computing and Machine Learning, CACML 2024, Shanghai, China, March 22-24, 2024. pages 158-164, ACM, 2024. [doi]
Abstract is missing.